Systematic Yield

Addressing Systematic Yield Issues Requires Innovative Tools

One of the key issues in maintaining competitiveness in the semiconductor manufacturing industry is reducing systematic yield loss. With tolerances now as small as 65 to 45 nanometers, the design of chips is more likely to interact with the manufacturing process in ways that are difficult to predict and correct. Finding the analytical tools to reduce systematic yield issues is a clear mandate for enterprises that want to maintain or increase market share. A variety of business analytics packages have been developed for this purpose, but none hold the promise of visual analytics. With visual analytics, engineers can interact with data visually to get faster answers to critical questions. In semiconductor manufacturers worldwide, engineers rely on Spotfire visual analytics for the systematic improvement of yield.

Spotfire® Visual Analytics Helps to Increase Systematic Yield

Spotfire delivers a visual analytics tool that can help semiconductor manufacturers extract answers from their data to improve systematic yield . Spotfire allows engineers to integrate multivariate data streams in a single platform, explore it visually, query it freely and get results immediately. The intuitive interface and the speed with which insight can be gained are Spotfire's most remarkable contributions to analytics that can address systematic issues in production. Spotfire enables defect specialists to optimize the use of inspection data and spectra to prioritize issues and quickly solve them, while creating methodologies to avoid recurrences. And Spotfire allows yield engineers to probe production drivers that may only be revealed by viewing data from in-line, lot history, electrical, bitmap and functional sources.

Additional Benefits in Semiconductor Manufacturing

In addition to solving systematic yield issues, Spotfire allows semiconductor manufacturers to:

• Analyze data faster to get products to market sooner and increase market share
• Achieve systematic improvement in device characterization technology
• Understand the impact of manufacturing variability on product yield, performance and cost
• Develop and maintain cutting-edge manufacturing processes across every fab module
• Reduce field failures and improve customer satisfaction by consistently utilizing best practices for analysis of WLR, DRB, HTOL and other critical reliability testing results
• Exploit new opportunities by quickly trading off device specifications vs. production capability

Spotfire supports a wide range of business intelligence systems and initiatives, such as attribution analysis in finance, pharmaceutical decision support, CRM analytics and other business intelligence software.

For more information on improving systematic yield with Spotfire, click here.

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